Type | Conference |
---|---|
Title | Artificial intelligence technique in solving nano-process parameter optimization problem |
Source | MITC2015-pp 304-305 |
Author | M.S. Norlina, M.S. Nor Diyana, P. Mazidah, M. Rusop |
This paper is proposing an Artificial
Intelligence (AI) technique in solving the RF magnetron
sputtering process parameter optimization problem. RF
magnetron sputtering is a physical vapor deposition
process which is widely used in the manufacturing of
thin films. In this research, the optimization of the
sputtering process parameters is to be solved
computationally based on gravitational search algorithm
(GSA).This study is concentrating on four process
parameters of RF magnetron sputtering process, which
are RF power, deposition time, oxygen flow rate and
substrate temperature. As for the material, zinc oxide
(ZnO) has been chosen due to its many significance
characteristics. For the validation purpose, GSA
performance was compared with particle swarm
optimization (PSO). Based on the results, GSA has
outperformed PSO in terms of the accuracy of the
optimization performance, fitness value and processing
time. The results showed that the AI approach in solving
this nano-process parameter optimization problem has
proven to be promising. This AI approach is expected to
improve the trial and error method by reducing the
number of experiments to be conducted in the parameter
optimization process. The implementation of this
computational technique could offer better time
management and lower cost consumption in the thin
film fabrication process.